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Nanoscale Phenomena in Ferroelectric Thin Films presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It consists of two main parts: electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well-known leading experts both in relevant academia and industry over the world U.
The objectives of the book are to provide the reader with the information needed to 1. Nanoscale ferroelectric materials, regardless of their dimensions film, wire, island , are receiving great interests from academia and industry due to their various potential applications such as memory and storage devices Ferroelectric Random Access Memory FRAM , Probe-based Data Storage PDS System, etc , sensors gas sensor, infrared detector, etc , and actuators micro-mirrors, ultrasonic devices, etc. This book provides the compass to navigate the unknown sea of information related to the nanoscale phenomena occurring in ferroelectric thin films.
The intended audience includes professional researchers and engineers in physics, electronics, chemistry, and materials science who are interested either in nanotechnology or ferroelectrics. Testing and characterization of ferroelectric thin film capacitors; In Kyeong Yoo.
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Test Circuits. Hysteric Property. Capacitance and Current. Stored Energy.
Leakage Current. Electrical Degradation. Pyroelectric Effect. Additional tests for commercial memory cells.source link
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Size effects in ferroelectric film capacitors: role of the film thickness and capacitor size; I. Size effects: role of the ferroelectric film thickness, impact of the passive layer and local charge injection. Size effects: role of the capacitor size and impact of nonhomogeneous stress. Conclusions and outlook. Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy; A.
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Experimental Approach. Variations in Ferroelectric Properties at the nanoscale. PFM studies of retention behavior. Nanoscale Leakage Current Mapping. Nanoscale dynamics in ferroelectric thin films; V. Nagarajan, R. Language : English.
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Type : Journal Article. Volume : Issue : 5. Start Page : End Page : Publisher : Elsevier B. From the journal. Current applied physics ISSN : Congratulations Publications saved.